ZEISS X-RAY TOMOGRAPHY SOLUTIONS
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes.
Highlights
- Characterize the properties and behaviors of your materials.
- Reveal details of microstructures in three dimensions (3D).
- Develop and confirm models or visualize structural details.
- Achieve high contrast and submicron resolution imaging even for relatively large samples.